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provided by FIZ Karlsruhe

New on STN

October 2013

Impacts of U.S. Government Shutdown on STN Databases

September 2013

Application Numbers for U.S. Patents in CA/CAplus and USPATFULL/USPAT2 Enhanced with U.S. Series Code Information

September 2013

Emtree Thesaurus Updated in Embase

Meet us at

ICIC - International Conference on Trends for Scientific Information Professionals, Vienna, Oct. 13.-16.

EPOPIC - EPO Patent Information Conference, Bologna, 22.-24.Oct

STN User Meetings

Frankfurt am Main, 08.10.2013
Hamburg, 29.10.2013
Wien, 12.11.2013

Solutions for IP Professionals

As an Intellectual Property (IP) professional, you can find science and technology information critical to your business needs - whether you do the searching yourself or have the search carried out by us.

We offer patent and literature databases from all over the world for answering questions related to:

  • Patentability
  • Prior art
  • Competitive intelligence
  • Legal status
  • Freedom-to-operate

To access the databases, you can use one or more of the following products:

STN - the online database service that connects you to patents, literature, substance information, and more
STN Express - comprehensive desktop access to the STN Databases 
STN on the WebSM - comprehensive web access to STN
STN Easy - web access for the occasional or novice searcher

You can search patent data such as:

  • Front page information, e.g., patent number, patent assignee, title
  • Abstracts
  • Full-text
  • Legal status
  • Patent family
  • Database specific indexing, e.g., names and structures for specific or Markush structures, sequences, concepts

To analyze or visualize your data, take advantage of:

  • STN Express tools to easily mine large data sets, look for trends, and create graphical depictions of data for use in reports and presentations
  • STN AnaVist™ features and capabilities for efficiently analyzing and interpreting information retrieved from scientific and patent databases
  • STN Viewer™ features for simple management and evaluation of full-text patent documents from STN Express answer sets